Lasers, Sensors and Related Equipment

1. Marine acoustic systems, equipment and specially designed components therefor.

2. Correlation-velocity sonar log equipment designed to measure the horizontal speed of the equipment carrier relative to the sea bed at distances between the carrier and the sea bed exceeding 500 m.

3. Space-qualified solid-state detectors.

4. Image intensifier tubes and specially designed components therefor.

5. Focal plane arrays.

6. Monospectral imaging sensors and multispectral imaging sensors designed for remote sensing applications.

7. Direct view imaging equipment operating in the visible or infrared spectrum.

8. Support components for optical sensors.

9. High speed cameras, mechanical or streak cameras, electronic cameras and specially designed components therefor.

10. Video cameras incorporating solid state sensors.

11. Scanning and imaging cameras and scanning camera systems.

12. Deformable mirrors having either continuous or multi-element surfaces, and specially designed components therefor.

13. Lightweight monolithic mirrors having an average equivalent density of less than 30 kg/m² and a total mass exceeding 10 kg.

14. Lightweight composite or foam mirror structures having an average equivalent density of less than 30 kg/m² and a total mass exceeding 2 kg.

15. Beam steering mirrors more than 100 mm in diameter or length of major axis.

16. Optical components made from zinc selenide (ZnSe) or zinc sulphide (ZnS).

17. Space-qualified components for optical systems.

18. Optical control equipment specially designed to maintain the surface figure or orientation of space-qualified components listed above.

19. Optical control equipment having steering, tracking, stabilization or resonator alignment bandwidths equal to or more than 100 Hz and an accuracy of 10 µr (microradians) or less.

20. Optical control gimbals.

21. Aspheric optical elements with the following: the largest dimension of the optical aperture is greater than 400 mm; the surface roughness is less than 1 nm(rms) for sampling lengths equal to or greater than 1 mm and the coefficient of linear thermal expansion's absolute magnitude is less than 3 x 10^-6/K at 25∫C.

22. Gas lasers.

23. Semiconductor lasers.

24. Solid state lasers.

25. Dye and other liquid lasers.

26. Argon ion lasers.

27. Pulsed carbon dioxide lasers.

28. Pulse-excited, Q-switched neodymium-doped (other than glass) lasers.

29. Carbon dioxide lasers.

30. Semiconductor lasers.

31. Solid state, non-tunable lasers.

32. Free electron lasers.

33. Lasers specifically designed, modified or configured for military application including those used in military communication devices, target designators and range finders, target detection systems, and directed energy weapons.

34. Laser welding machines.

35. Linear position feedback units.

36. Rotary position feedback units.

37. Mirrors cooled either by active cooling or by heat pipe cooling that are laser components.

38. Optical mirrors or transmissive or partially transmissive optical or electro-optical components specially designed for use with controlled lasers.

39. Dynamic wavefront (phase) measuring equipment.

40. Laser diagnostic equipment capable of measuring SHPL system angular beam steering errors of equal to or less than 10 µrad.

41. Optical equipment and components specially designed for a phased-array SHPL system for coherent beam combination.

42. Projection telescopes specially designed for use with SHPL systems.

43. Magnetometers, magnetic gradiometers, intrinsic magnetic gradiometers and compensation systems, and specially designed components therefor.

44. Radar systems, equipment and assemblies

45. Magnetic, pressure, and acoustic underwater detection devices specially designed for military purposes and controls and components therefor.

46. Radiation hardened detectors, for use in protecting against nuclear effects and usable for missiles.

47. Gravity meters (gravimeters), gravity gradiometers, and specially designed components therefor.

48. Radar and laser radar systems designed or modified for use in missiles.

49. Precision tracking systems, usable for missiles.

50. Photomultiplier tubes.

51. Mechanical rotating mirror cameras.

52. Electronic streak cameras, electronic framing cameras, tubes and devices.

53. Tunable pulsed single-mode dye laser oscillators.

54. Tunable pulsed dye laser amplifiers and oscillators.

55. Para-hydrogen Raman shifters.

56. Velocity interferometers for measuring velocities exceeding 1 km/s during time intervals of less than 10 microseconds.

57. Manganin gauges for pressures greater than 100 kilobars.

58. Quartz pressure transducers for pressures greater than 100 kilobars.

59. Marine or terrestrial acoustic equipment.

60. Image intensifier tubes and specially designed components therefor.

61. Optical filters.

62. Fluoride fiber cable, or optical fibers therefor, having an attenuation of less than 4 dB/km in the wavelength range exceeding 1,000 nm but not exceeding 3,000 nm.

63. Magnetometers having a noise level (sensitivity) lower (better) than 1.0 nT rms per square root Hz.

64. Airborne radar equipment and specially designed components therefor.

65. Space-qualified laser radar or Light Detection and Ranging (LIDAR) equipment specially designed for surveying or for meteorological observation.

66. Seismic detection equipment.

67. Equipment for measuring absolute reflectance to an accuracy of ±0.1% of the reflectance value.

68. Equipment having an unobscured aperture of more than 10 cm, specially designed for the non-contact optical measurement of a non-planar optical surface figure (profile) to an accuracy of 2 nm or less (better) against the required profile.

69. Equipment to produce, align and calibrate land-based gravity meters with a static accuracy of better than 0.1 mgal.

70. Pulse radar cross-section measurement systems having transmit pulse widths of 100 ns or less and specially designed components therefor.

71. Systems specially designed for radar cross section measurement.

72. Specially designed or modified equipment, including tools, dies, fixtures or gauges, and other specially designed components and accessories therefore, for (i) the manufacture or inspection of free electron laser magnet wigglers or free electron laser photo injectors or (ii) the adjustment, to required tolerances, of the longitudinal magnetic field of free electron lasers.

73. Elemental tellurium (Te) of purity levels of 99.9995% or more.

74. Single crystals (including epitaxial wafers) of cadmium zinc telluride (CdZnTe), cadmium telluride (CdTe) or mercury cadmium telluride (HgCdTe).

75. Zinc selenide (ZnSe) and zinc sulphide (ZnS) substrate blanks produced by the chemical vapor deposition process.

76. Boules of potassium titanyl arsenate (KTA); silver gallium selenide (AgGaSe²) or thallium arsenic selenide (Tl₃AsSe₃, also known as TAS).

77. Non-linear optical materials, having third order susceptibility (chi 3) of 10^-6 m2/V² or more and a response time of less than 1 ms.

78. Substrate blanks of silicon carbide or beryllium beryllium (Be/Be) deposited materials.

79. Glass, including fused silica, phosphate glass, fluorophosphate glass, zirconium fluoride (ZrF₄) and hafnium fluoride (HfF₄), having a hydroxyl ion (OH-) concentration of less than 5 ppm; integrated metallic purity levels of less than 1 ppm and high homogeneity (index of refraction variance) less than 5 x 10^-6.

80. Synthetically produced diamond material with an absorption of less than 10^-5 cm^-1 for wavelengths exceeding 200 nm but not exceeding 14,000 nm.

81. Synthetic crystalline laser host material in unfinished form: titanium doped sapphire and alexandrite.

82. Optical sensing fibers that are modified structurally to have a beat length of less than 500 mm (high birefringence) or optical sensor materials and having a zinc content of equal to or more than 6% by mole fraction.

83. Bulk fluoride compounds containing ingredients with a purity of 99.999% or better or comprised of zirconium or aluminum and variants.

84. Bulk fluoride glass.

85. Optical fiber preforms made from bulk fluoride compounds.

86. Software specially designed for the development, production or use of the items listed above.

87. Acoustic software.

88. Software specially designed for magnetic compensation systems for magnetic sensors designed to operate on mobile platforms.

89. Software specially designed for magnetic anomaly detection on mobile platforms.

90. Air Traffic Control software application programs.

91. Software for the design or production of radomes.

92. Software that processes post-flight, recorded data enabling determination of vehicle position throughout its flight path.

93. Technology for the development, production or use of the items listed above.

94. Optical surface coating and treatment technology.

95. Optical fabrication technology.

96. Technology required for the development, production or use of specially designed diagnostic instruments or targets in test facilities for SHPL testing or testing or evaluation of materials irradiated by SHPL beams.

97. Technology required for the development or production of fluxgate magnetometers or fluxgate magnetometer systems.

98. Optical fabrication technologies for serially producing optical components at a rate exceeding 10 m² of surface area per year on any single spindle.

99. Technology for optical filters with a bandwidth equal to or less than 10 nm, a field of view (FOV) exceeding 40∫ and a resolution exceeding 0.75 line pairs per milliradian.